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Global (United States, European Union and China) Thin Film Metrology Systems Market Research Report 2019-2025
SKU ID : QYR-14571021 | Publishing Date : 19-Aug-2019 | No. of pages : 118
Thin film metrology systems are used to measure the film thickness accurately. A series of film layers that act as a conductors, semiconductors, or bare wafers are deposited on an IC during IC fabrication. Thin film metrology systems are required during thin film deposition process to monitor and measure thin film parameters such as thickness, resistivity, and stress.
The growing demand for miniaturization and integration of semiconductors is the primary factor driving the global market for thin film metrology systems. Miniaturization of IC has been a result of high level integration to add functionalities on a single device, which is anticipated to escalate the demand for thin film metrology systems until 2023. Thin film metrology systems also help in improving the efficiency of semiconductor manufacturing processes, and as the demand for semiconductor devices escalates due to the thriving electronics industry, the market for thin film metrology systems will be benefitted. These systems are also applicable in manufacturing complex semiconductor ICs, which has led to architectures such as 3D and FinFET. This factor will further propell the thin films metrology systems demand. Conversely, demand fluctuation in semiconductor industries is the factor expected to hinder the growth rate during the forecast period.
North America serves the maximum demand, owing to factors such as surging demand for electronic goods and high purchasing ability of the consumers. However, Asia Pacific, which resides nearly the half of world’s population, is also projected for a healthy growth rate.
In 2019, the market size of Thin Film Metrology Systems is xx million US$ and it will reach xx million US$ in 2025, growing at a CAGR of xx% from 2019; while in China, the market size is valued at xx million US$ and will increase to xx million US$ in 2025, with a CAGR of xx% during forecast period.
In this report, 2018 has been considered as the base year and 2019 to 2025 as the forecast period to estimate the market size for Thin Film Metrology Systems.
This report studies the global market size of Thin Film Metrology Systems, especially focuses on the key regions like United States, European Union, China, and other regions (Japan, Korea, India and Southeast Asia).
This study presents the Thin Film Metrology Systems production, revenue, market share and growth rate for each key company, and also covers the breakdown data (production, consumption, revenue and market share) by regions, type and applications. history breakdown data from 2014 to 2019, and forecast to 2025.
For top companies in United States, European Union and China, this report investigates and analyzes the production, value, price, market share and growth rate for the top manufacturers, key data from 2014 to 2019.
In global market, the following companies are covered:
KLA-Tencor
Nanometrics
Nova Measuring Instruments
Rudolph Technologies
SCREEN Holdings
Semilab
...
Market Segment by Product Type
Opaque Films
Transparent Films
Thick Films
Others
Market Segment by Application
Semiconductor
MEMS
Data Storage
High-Brightness LED (HB-LED)
Nanometrics
Others
Key Regions split in this report: breakdown data for each region.
United States
China
European Union
Rest of World (Japan, Korea, India and Southeast Asia)
The study objectives are:
To analyze and research the Thin Film Metrology Systems status and future forecast in United States, European Union and China, involving sales, value (revenue), growth rate (CAGR), market share, historical and forecast.
To present the key Thin Film Metrology Systems manufacturers, presenting the sales, revenue, market share, and recent development for key players.
To split the breakdown data by regions, type, companies and applications
To analyze the global and key regions market potential and advantage, opportunity and challenge, restraints and risks.
To identify significant trends, drivers, influence factors in global and regions
To analyze competitive developments such as expansions, agreements, new product launches, and acquisitions in the market
In this study, the years considered to estimate the market size of Thin Film Metrology Systems are as follows:
History Year: 2014-2018
Base Year: 2018
Estimated Year: 2019
Forecast Year 2019 to 2025
The growing demand for miniaturization and integration of semiconductors is the primary factor driving the global market for thin film metrology systems. Miniaturization of IC has been a result of high level integration to add functionalities on a single device, which is anticipated to escalate the demand for thin film metrology systems until 2023. Thin film metrology systems also help in improving the efficiency of semiconductor manufacturing processes, and as the demand for semiconductor devices escalates due to the thriving electronics industry, the market for thin film metrology systems will be benefitted. These systems are also applicable in manufacturing complex semiconductor ICs, which has led to architectures such as 3D and FinFET. This factor will further propell the thin films metrology systems demand. Conversely, demand fluctuation in semiconductor industries is the factor expected to hinder the growth rate during the forecast period.
North America serves the maximum demand, owing to factors such as surging demand for electronic goods and high purchasing ability of the consumers. However, Asia Pacific, which resides nearly the half of world’s population, is also projected for a healthy growth rate.
In 2019, the market size of Thin Film Metrology Systems is xx million US$ and it will reach xx million US$ in 2025, growing at a CAGR of xx% from 2019; while in China, the market size is valued at xx million US$ and will increase to xx million US$ in 2025, with a CAGR of xx% during forecast period.
In this report, 2018 has been considered as the base year and 2019 to 2025 as the forecast period to estimate the market size for Thin Film Metrology Systems.
This report studies the global market size of Thin Film Metrology Systems, especially focuses on the key regions like United States, European Union, China, and other regions (Japan, Korea, India and Southeast Asia).
This study presents the Thin Film Metrology Systems production, revenue, market share and growth rate for each key company, and also covers the breakdown data (production, consumption, revenue and market share) by regions, type and applications. history breakdown data from 2014 to 2019, and forecast to 2025.
For top companies in United States, European Union and China, this report investigates and analyzes the production, value, price, market share and growth rate for the top manufacturers, key data from 2014 to 2019.
In global market, the following companies are covered:
KLA-Tencor
Nanometrics
Nova Measuring Instruments
Rudolph Technologies
SCREEN Holdings
Semilab
...
Market Segment by Product Type
Opaque Films
Transparent Films
Thick Films
Others
Market Segment by Application
Semiconductor
MEMS
Data Storage
High-Brightness LED (HB-LED)
Nanometrics
Others
Key Regions split in this report: breakdown data for each region.
United States
China
European Union
Rest of World (Japan, Korea, India and Southeast Asia)
The study objectives are:
To analyze and research the Thin Film Metrology Systems status and future forecast in United States, European Union and China, involving sales, value (revenue), growth rate (CAGR), market share, historical and forecast.
To present the key Thin Film Metrology Systems manufacturers, presenting the sales, revenue, market share, and recent development for key players.
To split the breakdown data by regions, type, companies and applications
To analyze the global and key regions market potential and advantage, opportunity and challenge, restraints and risks.
To identify significant trends, drivers, influence factors in global and regions
To analyze competitive developments such as expansions, agreements, new product launches, and acquisitions in the market
In this study, the years considered to estimate the market size of Thin Film Metrology Systems are as follows:
History Year: 2014-2018
Base Year: 2018
Estimated Year: 2019
Forecast Year 2019 to 2025
Frequently Asked Questions
This market study covers the global and regional market with an in-depth analysis of the overall growth prospects in the market. Furthermore, it sheds light on the comprehensive competitive landscape of the global market. The report further offers a dashboard overview of leading companies encompassing their successful marketing strategies, market contribution, recent developments in both historic and present contexts.
- By product type
- By End User/Applications
- By Technology
- By Region
The report provides a detailed evaluation of the market by highlighting information on different aspects which include drivers, restraints, opportunities, and threats. This information can help stakeholders to make appropriate decisions before investing.
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